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KMID : 0381920030330030179
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Korean Journal of Microscopy
2003 Volume.33 No. 3 p.179 ~ p.185
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A Method to Determine the Wavelength of Electron Beam from LACBED Pattern
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김황수/Kim HS
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Abstract
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KEYWORD
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Electron wavelength, LACBED, QCBED
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FullTexts / Linksout information
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Listed journal information
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